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5302. Structural Analysis

Also offered as: IMS 5302

3.00 credits

Prerequisites: None.

Grading Basis: Graded

Lecture on sample preparation and analyses for X-ray diffraction, X-ray fluorescence, X-ray imaging, Rietveld refinement, Thin Film X-ray Analyses, and In Situ methods.


Last Refreshed: 19-APR-24 05.20.07.775487 AM
To view current class enrollment click the refresh icon next to the enrollment numbers.
Section Class Number Notes Instructor Enrollment Session Instruction Mode
001 11106 Suib, Steven
Morales Acosta, M.
1/10 Reg Online Asynchronous