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5322. Materials Characterization
3.00 credits
Prerequisites:
Grading Basis: Graded
A review of the principal experimental methods used to reveal the microstructure and chemistry of materials. Diffraction techniques: x-ray, electron, neutron and proton scattering. Photon probes: photon microscopies, x-ray topography and XPS. Electron probes: SEM, TEM, EDX, EELS, AES. Atom and ion probes: RBS, SIMS, FIM, PIXE. Scanned probe microscopies.
Last Refreshed: 02-JAN-25 05.20.24.288918 AM
| Enrollment Data | Section | Class Number | Notes | Instructor | Enrollment | Session | Instruction Mode |
|---|---|---|---|---|---|---|---|
| 1248 9837 1 001X | 001X | 9837 | Zhu, Yuanyuan | 5/25 | Reg | Online Synchronous |