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5301. Microstructural and Morphological Analyses

Also offered as: IMS 5301

3.00 credits

Prerequisites:

Grading Basis: Graded

Lecture on sample preparation and analyses for optical and electron microscopy methods including scanning electron microscopy, transmission electron microscopy, energy dispersive X-ray analysis, focused ion beam methods, and electron energy loss spectroscopy.


Last Refreshed: 20-DEC-24 05.20.17.275138 AM
To view current class enrollment click the refresh icon next to the enrollment numbers.
Section Class Number Notes Instructor Enrollment Session Instruction Mode
002 3592 Suib, Steven
March, Seth
5/10 Reg Online Asynchronous